Changes in Beneficial Ownership · 4

Aehr Test Systems

AEHRNASDAQEQUITYCurrent

Changes in Beneficial Ownership

Filed Sep 1, 2026Accepted Sep 1, 2026, 6:02 PM EDTFiling CIK 1040470Accession 0001040470-26-000263

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Structured filing — 4

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Filing details

Report period: 2026-09-01
Issuer: AEHR TEST SYSTEMS
Issuer CIK: 0001040470
Trading symbol: AEHR

Reporting owner 1

Name: Siu Chris
Reporting owner CIK: 0001389044
Relationship: Officer
Officer title: CFO
Address: C/O AEHR TEST SYSTEMS, 400 KATO TERRACE, FREMONT, CA, 94539

Non-derivative transactions

Non-derivative transactions · 1 reported row
Security	Transaction date	Code	Amount	A / D	Price (USD)	Owned after	Ownership
Common Stock	2026-09-01	F · Form 4	496^[F1]	D	76.59	77,328^[F2]	D

Table key

F · Form 4: Securities delivered or withheld for exercise price or tax liability under Rule 16b-3
D: Direct

Non-derivative holdings

Non-derivative holdings · 1 reported row
Security	Amount owned	Ownership	Nature of ownership
Common Stock	5,706	I	By Trust

Table key

I: Indirect

Footnotes

F1: Represents shares that were withheld to satisfy tax withholding obligations upon vesting of restricted stock units and restricted shares. This does not represent a sale by the Reporting Person.↩ 1
F2: The amount reported includes shares subject to unvested restricted stock units.↩ 1

Signature 1

Signed: /s/SIU CHRIS
Date: 2026-09-01

Company context

Headquartered in Fremont, California, Aehr Test Systems is a leading provider of test solutions for testing, burning in, and stabilizing semiconductor devices in wafer-level, singulated die, and package-level form, and has installed thousands of systems worldwide. Increasing quality, reliability, safety, and security needs of semiconductors used across multiple applications, including advanced AI processors, silicon photonics, data and telecommunications infrastructure, electric vehicles, electric vehicle charging infrastructure, solar and wind power, computing, and solid-state memory and storage are driving additional test requirements, incremental capacity needs, and new opportunities for Aehr’s products and solutions. Aehr has developed and introduced several innovative products including the FOX-PTM families of test and burn-in systems and the FOX WaferPakTM Aligner, FOX WaferPak Contactor, FOX DiePak® Carrier and FOX DiePak Loader. The FOX-XP and FOX-NP systems are full-wafer contact and singulated die/module test and burn-in systems that can test, burn in, and stabilize a wide range of devices such as leading-edge silicon carbide-based and other power semiconductors, 2D and 3D sensors used in mobile phones, tablets, and other computing devices, memory semiconductors, processors, microcontrollers, systems-on-a-chip, and photonics and integrated optical devices. The FOX-CP system is a low-cost single-wafer compact test solution for logic, memory and photonic devices and t

Current securities

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